- sample thickness
- толщина образца
English-Russian dictionary of chemistre. 2014.
English-Russian dictionary of chemistre. 2014.
Thin-film thickness monitor — Thin film thickness monitors, deposition rate controllers, and so on, are a family of instruments used in high and ultra high vacuum systems. They can measure the thickness of a thin film, not only after it has been made, but while it is still… … Wikipedia
merchandise sample — A Standard Mail (A) piece that is more than 5 inches wide, 5 inches high, or 1/4 inch thick, or is nonuniform in thickness … Glossary of postal terms
core sample — n that part of a core of rock or coal obtained so as to represent accurately a thickness of a unit penetrating by drilling. D5192 … Coke&Coal Terminology
Microtome — A microtome used in microscopy. A microtome (from the Greek mikros, meaning small , and temnein, meaning to cut ) is a sectioning instrument that allows for the cutting of extremely thin slices of material, known as sections. Microtomes are an… … Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… … Wikipedia
Diffraction topography — (short: topography ) is an X ray imaging technique based on Bragg diffraction. Diffraction topographic images ( topographs ) record the intensity profile of a beam of X rays (or, sometimes, neutrons) diffracted by a crystal. A topograph thus… … Wikipedia
Van der Pauw method — The van der Pauw Method is a commonly used technique to measure the sheet resistance of a material. The Van der Pauw method is often used to measure the Hall effect, which characterises a sample of semiconductor material and can be successfully… … Wikipedia
Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the … Wikipedia
Particle-induced X-ray emission — or proton induced X ray emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the … Wikipedia
Ceramic matrix composite — Fracture surface of a fiber reinforced ceramic composed of SiC fibers and SiC matrix. The fiber pull out mechanism shown is the key to CMC properties … Wikipedia